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ScanAsyst-Air-HR probes are specifically designed for use with the ScanAsyst-HR fast scanning accessory on the MultiMode 8 AFM
200nm Thermal Oxide on 10x10mm diced Ultra-Flat Wafer
and with specific angles ideally suited to accommodate specimens with small working distances in FIB
Made of aluminum with brass clips
such as in microscopy and assembly applications
PELCO® Pin Stub Extender Grid Holder ScanAsyst-Air-HR probes are specifically designedDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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